Analysis Techniques – HarwellXPS

We are pleased to offer access to a comprehensive array of XPS systems and ancillary techniques, to meet the most demanding of analysis requirements. We are proud to host the most modern and complete range of X-ray photoelectron spectrometers in the UK. Follow the links below to find out more about some of the techniques we provide.

Angle Resolved XPS (ARXPS)

A non-destructive technique allowing an increase in the surface sensitivity of the technique by changing the angle at which electrons are detected.

Imaging XPS (iXPS)

Imaging XPS is useful for identifying small features, understanding the distribution surface chemistry or examining the thickness variation of an ultra-thin coating.

Ultraviolet Photoelecton Spectroscopy (UPS)

Analogous to XPS, this technique uses He I or He II generated photons to study the outermost electronic shells (valence and conduction bands)

Ion Scattering Spectroscopy (ISS/LEIS)

Ion scattering is a highly surface sensitive spectroscopy which perfectly compliments the chemical and quantitative analysis offered by XPS.

Electron Energy Loss Spectroscopy (REELS)

A useful technique in the semi-quantitative determination of hydrogen content and probing electronic structure.

Depth Profiling

Using an ion beam to etch layers of the surface to reveal subsurface information.

High Energy XPS (HAXPES)

The utilisation of higher excitation energies facilitating an increase in the electron information depth to probe buried layers.

Near-Ambient Pressure XPS (NAPXPS)

Allows for chacterisation of materials under realsitic reaction conditions