Technical & Application Notes
We are delighted to offer technical and application notes relating to XPS analysis and related techniques. If there is anything you would like to see - let us know!
Technical Notes
Download technical notes created by our staff to aid your understanding and data analysis.
Oxide Thickness Determination Using the Strohmeier Equation
Overlayer thickness Determination using the Thickogram and Topofactors
An Introduction
to
Multiplet Splitting
Auger Peaks, the Auger Parameter and Chemical State Plots
Application Notes
Download application notes on how XPS analysis can help you.
High Energy XPS
Discover the advantages of using a higher energy photon source