We are often asked about papers we recommend on the topic of XPS analysis.  Whilst this can be very subjective, the papers can also span several decades of work, with many refinements to the original papers along the way possibly complicating matters for some users.  However, below are several more recent papers that we believe are important in understanding and approaching XPS analysis.

• Detection limits in XPS for more than 6000 binary systems using Al and Mg Kα X‐rays

• Improved XPS analysis by visual inspection of the survey spectrum

• Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements

• The use and misuse of curve fitting in the analysis of core X‐ray photoelectron spectroscopic data

• Tutorial on interpreting x-ray photoelectron spectroscopy survey spectra: Questions and answers on spectra from the atomic layer deposition of Al₂O₃ on silicon