Technical & Application Notes

We are delighted to offer technical and application notes relating to XPS analysis and related techniques.  If there is anything you would like to see - let us know!

Technical Notes

Download technical notes created by our staff to aid your understanding and data analysis.

Oxide Thickness Determination Using the Strohmeier Equation

Overlayer thickness Determination using the Thickogram and Topofactors

An Introduction


Multiplet Splitting

Auger Peaks, the Auger Parameter and Chemical State Plots

Application Notes

Download application notes on how XPS analysis can help you.

High Energy XPS

Discover the advantages of using a higher energy photon source